Microstructure observation of electromigration behavior in peripheral C2 flip chip interconnection with solder capped Cu pillar bumpYasumitsu OriiKazushige Toriyamaet al.2011IMAPS 2011
Electromigration analysis of peripheral ultra fine pitch C2 flip chip interconnection with solder capped Cu pillar bumpYasumitsu OriiKazushige Toriyamaet al.2011ECTC 2011
Development of vacuum underfill technology for a 3D chip stackKatsuyuki SakumaSayuri Koharaet al.2011JMM
Performance improvement of stacked graphite sheets for cooling applicationsYoichi TairaSayuri Koharaet al.2008ECTC 2008