Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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193 results for Christian Lavoie

Axiotaxy and epitaxial textures in C54-TiSi₂ films on Si(0 0 1) and Si(1 1 1) substrates
- - F.A. Geenen
  - Jean L. Jordan-Sweet
  - et al.
- 2018
- Journal of Physics D: Applied Physics
Electronic and structural analysis of ultra-small-diameter metal disilicide nanowires
- - Nicholas A. Lanzillo
  - T. Standaert
  - et al.
- 2017
- Journal of Applied Physics
Atomic layer deposited ultrathin metal nitride barrier layers for ruthenium interconnect applications
- - Sonal Dey
  - Kai-Hung Yu
  - et al.
- 2017
- JVSTA
Formation of nickel germanides from Ni layers with thickness below 10 nm
- - Lukas Jablonka
  - Tomas Kubart
  - et al.
- 2017
- JVSTB
Texture in thin film silicides and germanides: A review
- - B. De Schutter
  - K. De Keyser
  - et al.
- 2016
- Applied Physics Reviews
Gas cluster ion beam assisted NiPt germano-silicide formation on SiGe
- - Ahmet S. Ozcan
  - Christian Lavoie
  - et al.
- 2016
- Journal of Applied Physics
Challenges of nickel silicidation in CMOS technologies
- - Nicolas Breil
  - Christian Lavoie
  - et al.
- 2015
- Microelectronic Engineering
Compositional dependence of the optical conductivity of Ni_{1 - X}Pt_x alloys (0 < x < 0.25) determined by spectroscopic ellipsometry
- - Lina S. Abdallah
  - Stefan Zollner
  - et al.
- 2014
- Thin Solid Films
On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films
- - F.A. Geenen
  - W. Knaepen
  - et al.
- 2014
- Journal of Alloys and Compounds
Optical conductivity of Ni_1-_xPt_xSi monosilicides (0 < x < 0.3) from spectroscopic ellipsometry
- - Lina S. Abdallah
  - Stefan Zollner
  - et al.
- 2014
- JVSTB