In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering
- Tuan T. Tran
- Lukas Jablonka
- et al.
- 2020
- Scientific Reports
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.