Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
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30 results for Saibal Mukhopadhyay
Device-optimization technique for robust and low-power FinFET SRAM design in NanoScale era
- Aditya Bansal
- Saibal Mukhopadhyay
- et al.
- 2007
- IEEE Transactions on Electron Devices
Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
- Saibal Mukhopadhyay
- Keejong Kim
- et al.
- 2007
- IEEE Journal of Solid-State Circuits
Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- ISSCC 2007
Modeling and analysis of leakage currents in double-gate technologies
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Optimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Electron Device Letters
Modeling and analysis of gate leakage in ultra-thin oxide sub-50nm double gate devices and circuits
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2005
- ISQED 2005
Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2005
- ISLPED 2005
A forward body-biased low-leakage SRAM cache: Device, circuit and architecture considerations
- Chris Hyung-Il Kim
- Jae-Joon Kim
- et al.
- 2005
- IEEE Transactions on VLSI Systems
Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2004
- ESSCIRC 2004