Counterfeit IC detection using light emission
- Peilin Song
- Franco Stellari
- et al.
- 2014
- IEEE ITC 2014
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61 results for Alan J. Weger
Applications and techniques for 2D picosecond imaging for circuit analysis
- Franco Stellari
- Peilin Song
- et al.
- 2014
- ISTFA 2014
Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- ISTFA 2014
Ultra-low voltage time-resolved emission measurements from 32 nm SOI CMOS integrated circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- ISTFA 2014
Modeling of transient and static components of intrinsic emission from VLSI circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- IRPS 2014
Verification of untrusted chips using trusted layout and emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2014
- HOST 2014
32nm CMOS SOI test site for emission tool evaluation
- Alan J. Weger
- Franco Stellari
- et al.
- 2013
- ISTFA 2013
A Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuits
- Franco Stellari
- Alan J. Weger
- et al.
- 2013
- ISTFA 2013
Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2013
- ISTFA 2013
Near-infrared photon emission spectroscopy trends in scaled SOI technologies
- Ulrike Kindereit
- Alan J. Weger
- et al.
- 2012
- ISTFA 2012