Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits
- Stas Polonsky
- Alan Weger
- et al.
- 2002
- ISTFA 2002
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61 results for Alan J. Weger
Timing characterization of Multiple Timing Domains
- Alan J. Weger
- Moyra McManus
- et al.
- 2002
- ISTFA 2002
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
Single photon detectors for ultra low voltage time-resolved emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2011
- IEEE JQE
A thermal simulation process based on electrical modeling for complex interconnect, packaging, and 3DI structures
- Lijun Jiang
- Chuan Xu
- et al.
- 2010
- IEEE Transactions on Advanced Packaging
Product yield prediction system and critical area database
- Thomas S. Barnett
- Jeanne P. Bickford
- et al.
- 2008
- IEEE Trans Semicond Manuf
Hotspot-limited microprocessors: Direct temperature and power distribution measurements
- Hendrik F. Hamann
- Alan Weger
- et al.
- 2007
- IEEE Journal of Solid-State Circuits
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
Off-state luminescence in metal-oxide-semiconductor field-effect transistors and Its use as on-chip voltage probe
- Stas Polonsky
- Alan Weger
- 2004
- Applied Physics Letters
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis