Compact Model of a Bulk FinFET Quantum Dot Toward Single Chip Integration of Qubits and Control Electronics for Quantum Computing Applications
- Sujit Kumar Singh
- Deepesh Sharma
- et al.
- 2023
- IEEE T-ED
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21 results for Abhisek Dixit
Effective Channel Mobility Extraction and Modeling of 10-nm Bulk CMOS FinFETs in Cryogenic Temperature Operation for Quantum Computing Applications
- Sumreti Gupta
- Sujit Kumar Singh
- et al.
- 2023
- IEEE T-ED
Impact of gamma-ray radiation on DC and RF performance of 10-nm bulk n-channel FinFETs
- K. Aditya
- R. Singh
- et al.
- 2020
- IEEE T-DMR
Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- Charu Gupta
- Anshul Gupta
- et al.
- 2020
- IEEE T-ED
Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- Anshul Gupta
- Charu Gupta
- et al.
- 2019
- IEEE T-ED
Modeling of Effective Thermal Resistance in Sub-14-nm Stacked Nanowire and FinFETs
- Ishita Jain
- Anshul Gupta
- et al.
- 2018
- IEEE T-ED
Series Resistance Reduction with Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET
- Anil K. Bansal
- Manoj Kumar
- et al.
- 2018
- IEEE T-ED
3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes
- Anil K. Bansal
- Charu Gupta
- et al.
- 2018
- IEEE T-ED
Analytical Modeling of Parasitic Capacitance in Inserted-Oxide FinFETs
- R. Singh
- Anshul Gupta
- et al.
- 2017
- IEEE T-ED
Series resistance reduction in stacked nanowire FETs for 7-nm CMOS technology
- Anil K. Bansal
- Ishita Jain
- et al.
- 2016
- IEEE J-EDS