Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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5 results for C. Molella

Characterizing junction profiles in Ge photodetectors using scanning capacitance microscopy (SCM) and electron holography
- - J. Nxumalo
  - Yun-Yu Wang
  - et al.
- 2018
- IWJT 2018
Leakage issues in failure analysis of P+ SiGe active area short monitor
- - Ankur Arya
  - Greg M. Johnson
  - et al.
- 2011
- IPFA 2011
Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy
- - Laura Kosbar
  - Jochonia Nxumalo
  - et al.
- 2010
- PVSC 2010
Towards routine backside SIMS sample preparation for efficient support of advanced IC process development
- - M. Hopstaken
  - C. Cabral Jr.
  - et al.
- 2009
- FCMN 2009
Impurity measurements in silicon with D-SIMS and atom probe tomography
- - P.A. Ronsheim
  - P. Flaitz
  - et al.
- 2008
- Applied Surface Science