Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- Microelectronics Reliability
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46 results for Jae-Joon Kim
A 32 kb 10T sub-threshold sram array with bit-interleaving and differential read scheme in 90 nm CMOS
- Ik Joon Chang
- Jae-Joon Kim
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2008
- ICICDT 2008
Capacitive coupling based transient negative bit-line voltage (tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies
- S. Mukhopadhyay
- R.M. Rao
- et al.
- 2008
- ISCAS 2008
Design and analysis of a self-repairing SRAM with on-chip monitor and compensation circuitry
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2008
- VTS 2008
On-chip process variation detection using slew-rate monitoring circuit
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- VLSID 2008
Optimal dual-VT design in sub-100 nanometer PDSOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- VLSID 2008
Optimal dual-VT design in sub-100-nm PD/SOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
Completely digital on-chip circuit for local-random-variability measurement
- Rahul Rao
- Keith A. Jenkins
- et al.
- 2008
- ISSCC 2008
A 32kb 10T subthreshold SRAM array with bit-interleaving and differential read scheme in 90nm CMOS
- Ik Joon Chang
- Jae-Joon Kim
- et al.
- 2008
- ISSCC 2008