In-situ focused ion beam micropatterning of Ge islands
- M. Kammler
- R. Hull
- et al.
- 2003
- Microscopy and Microanalysis
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13 results for Martin Kammler
Lateral control of self-assembled island nucleation by focused-ion-beam micropatterning
- M. Kammler
- R. Hull
- et al.
- 2003
- Applied Physics Letters
High concentration Bi δ-doping layers on Si(001)
- J. Falta
- O. Mielmann
- et al.
- 1998
- Applied Surface Science