Access transistor design and optimization for 65/45nm high performance SOI eDRAM
- G. Wang
- P. Parries
- et al.
- 2008
- VLSI-TSA 2008
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79 results for Jin Cai
Effect of end-of-range defects on device leakage in direct silicon bonded (DSB) technology
- Haizhou Yin
- M. Hamaguchi
- et al.
- 2008
- VLSI-TSA 2008
Assessing the high-temperature capabilities of SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- John D. Cressler
- et al.
- 2007
- BCTM 2007
1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Peng Cheng
- et al.
- 2007
- SPIE International Symposium on Fluctuations and Noise 2007
35nm SOI-CMOS for sub-ambient temperature operation
- Cai Jin
- David J. Frank
- et al.
- 2007
- VLSI-TSA 2007
A 3-transistor DRAM cell with gated diode for enhanced speed and retention time
- Wing K. Luk
- Jin Cai
- et al.
- 2006
- VLSI Circuits 2006
Reliability issues in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Tianbing Chen
- et al.
- 2006
- BCTM 2006
Simulation analysis of series resistance for SOI MOSFET in nanometer regime
- Xinlin Wang
- Phil Oldiges
- et al.
- 2005
- SISPAD 2005
Mobility and CMOS devices/circuits on sub-10nm (110) ultra thin body SOI
- Huiling Shang
- J. Rubino
- et al.
- 2005
- VLSI Technology 2005
Substrate bias effects in vertical SiGe HBTs fabricated on CMOS-compatible thin film SOI
- Tianbing Chen
- Marco Bellini
- et al.
- 2005
- BCTM 2005