Measurements of carrier transport in MOSFETs with bottom-up nanowire channel as a function of the nanowire diameter
- G.M. Cohen
- S. Bangsaruntip
- et al.
- 2008
- DRC 2008
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79 results for Jin Cai
Access transistor design and optimization for 65/45nm high performance SOI eDRAM
- G. Wang
- P. Parries
- et al.
- 2008
- VLSI-TSA 2008
Effect of end-of-range defects on device leakage in direct silicon bonded (DSB) technology
- Haizhou Yin
- M. Hamaguchi
- et al.
- 2008
- VLSI-TSA 2008
Assessing the high-temperature capabilities of SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- John D. Cressler
- et al.
- 2007
- BCTM 2007
Ultra-low leakage silicon-on-insulator technology for 65 nm node and beyond
- Jin Cai
- Amlan Majumdar
- et al.
- 2007
- IEDM 2007
1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Peng Cheng
- et al.
- 2007
- SPIE International Symposium on Fluctuations and Noise 2007
35nm SOI-CMOS for sub-ambient temperature operation
- Cai Jin
- David J. Frank
- et al.
- 2007
- VLSI-TSA 2007
A perspective on today's scaling challenges and possible future directions
- Robert H. Dennard
- Jin Cai
- et al.
- 2007
- Solid-State Electronics
X-ray irradiation and bias effects in fully-depleted and partially-depleted SiGe HBTs fabricated on CMOS-compatible SOI
- Marco Bellini
- Bongim Jun
- et al.
- 2006
- IEEE TNS
Reliability issues in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Tianbing Chen
- et al.
- 2006
- BCTM 2006