The origin of massive nonlinearity in Mixed-Ionic-Electronic-Conduction (MIEC)-based Access Devices, as revealed by numerical device simulation
- Alvaro Padilla
- Geoffrey W. Burr
- et al.
- 2014
- DRC 2014
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30 results for Kota V. R. M. Murali
Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- Japanese Journal of Applied Physics
CMOS logic device and circuit performance of Si gate all around nanowire MOSFET
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- IEEE T-ED
Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- Mohit Bajaj
- Rajan K. Pandey
- et al.
- 2013
- IEEE T-ED
Dielectric-environment mediated quantum screening of two-dimensional electron gas
- Aniruddha Konar
- Mohit Bajaj
- et al.
- 2013
- Journal of Applied Physics
Characterization and optimization of charge trapping in high-k dielectrics
- Eduard Cartier
- Takashi Ando
- et al.
- 2013
- IRPS 2013
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED
Role of point defects and HfO2/TiN interface stoichiometry on effective work function modulation in ultra-scaled complementary metal-oxide-semiconductor devices
- Rajan K. Pandey
- Rajesh Sathiyanarayanan
- et al.
- 2013
- Journal of Applied Physics
Dielectric properties of Si3-ξGeξN4 and Si3-ξCξN4: A density functional study
- Kanchan Ulman
- Rajesh Sathiyanarayanan
- et al.
- 2013
- Journal of Applied Physics
Combined optical and electrical analysis of efficiency enhancement in solar cells with embedded dielectric nanoparticles
- M.S. Murthy
- Mohit Bajaj
- et al.
- 2013
- PVSC 2013