Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2015
- IEEE T-ED
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30 results for Kota V. R. M. Murali
On the origin of steep i - V nonlinearity in mixed-ionic-electronic-conduction-based access devices
- Alvaro Padilla
- Geoffrey W. Burr
- et al.
- 2015
- IEEE T-ED
Nitrogen diffusion in hafnia and the impact of nitridation on oxygen and hydrogen diffusion: A first-principles study
- Rajesh Sathiyanarayanan
- Rajan K. Pandey
- et al.
- 2015
- Journal of Applied Physics
Tunneling-triggered bipolar action in junctionless tunnel field-effect transistor
- Suresh Gundapaneni
- Aranya Goswami
- et al.
- 2014
- Applied Physics Express
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED
Finite element based three dimensional Schrödinger solver for nano-scale devices
- Samarth Agarwal
- Kai Xiu
- et al.
- 2014
- Journal of Computational Electronics
Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- Japanese Journal of Applied Physics
CMOS logic device and circuit performance of Si gate all around nanowire MOSFET
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- IEEE T-ED
Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- Mohit Bajaj
- Rajan K. Pandey
- et al.
- 2013
- IEEE T-ED
Dielectric-environment mediated quantum screening of two-dimensional electron gas
- Aniruddha Konar
- Mohit Bajaj
- et al.
- 2013
- Journal of Applied Physics