Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.