The negative bias temperature instability in MOS devices: A review
- J.H. Stathis
- S. Zafar
- 2006
- Microelectronics Reliability
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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58 results for Sufi Zafar
Threshold voltage instabilities in high-κ gate dielectric stacks
- Sufi Zafar
- Arvind Kumar
- et al.
- 2005
- IEEE T-DMR
Threshold voltage control in NiSi-Gated MOSFETs through SIIS
- Jakub Kedzierski
- Diane Boyd
- et al.
- 2005
- IEEE Transactions on Electron Devices
Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks
- Sufi Zafar
- Alessandro Callegari
- et al.
- 2003
- Journal of Applied Physics
Impact of moisture on charge trapping and flatband voltage in Al 2O3 gate dielectric films
- Sufi Zafar
- A.C. Callegari
- et al.
- 2002
- Applied Physics Letters
A method for measuring barrier heights, metal work functions and fixed charge densities in metal/SiO2/Si capacitors
- Sufi Zafar
- Cyril Cabral Jr.
- et al.
- 2002
- Applied Physics Letters
Measurement of barrier heights in high permittivity gate dielectric films
- S. Zafar
- E. Cartier
- et al.
- 2002
- Applied Physics Letters
Ultrathin high-K gate stacks for advanced CMOS devices
- E. Gusev
- D.A. Buchanan
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting