High electron density effects in electron spectroscopies: Consequences for picosecond photoemission and electron-beam sampling
- Rolf Clauberg
- Armin Blacha
- 1989
- Journal of Applied Physics
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Contactless high-speed waveform measurements on GaAs integrated circuits with the photoemission sampling technique
- H.K. Seitz
- A. Blacha
- et al.
- 1989
- European Test Conference 1989
Progress in photoemission sampling
- H. Beha
- R. Clauberg
- et al.
- 1989
- CompEuro 1989
Laser-beam photoemission testing of ultrafast integrated circuits
- R. Clauberg
- H. Beha
- 1989
- Mikroelektronik
Development of the spin-resolved photoemission spectroscopy for magnetic materials
- R. Clauberg
- 1988
- Vakuum-Technik
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission
- R. Clauberg
- A. Blacha
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Direct and inverse surface photoemission: Sources of ambiguities near the fermi level
- R. Clauberg
- K.H. Frank
- et al.
- 1987
- Surface Science
Microfields in stroboscopic voltage measurements via electron emisson. II. Effects on electron dynamics
- Rolf Clauberg
- 1987
- Journal of Applied Physics
Photoemission sampling technique for high-speed integrated-circuit testing
- H. Beha
- H.K. Seitz
- et al.
- 1987
- Microelectronic Engineering