Time-resolved measurements of self-heating in SOI and strained-Si MOSFETs using off-state leakage current luminescence
- Stas Polonsky
- Keith A. Jenkins
- 2003
- ISDRS 2003
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.