The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2017
- IEEE TNS
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3 results for Brendan D. McNally
Measurements of radioactive contaminants in semiconductor materials
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2016
- Semiconductor Science and Technology
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS