Praneet Adusumilli, Lincoln J. Lauhon, et al.
Applied Physics Letters
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Praneet Adusumilli, Lincoln J. Lauhon, et al.
Applied Physics Letters
Y.Y. Wang, John Bruley, et al.
Applied Physics Letters
A.J. KleinOsowski, Ethan H. Cannon, et al.
IEEE TNS
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS