Conal E. Murray, K.L. Saenger
Journal of Applied Physics
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Conal E. Murray, K.L. Saenger
Journal of Applied Physics
Seung-Hyun Rhee, Conal E. Murray, et al.
MRS Spring Meeting 2006
Larry Wissel, Ethan H. Cannon, et al.
IEEE TNS
Grégory Abadias, Eric Chason, et al.
JVSTA