A non-iterative compact model for carbon nanotube FETs incorporating source exhaustion effects
- Lan Wei
- David J. Frank
- et al.
- 2009
- IEDM 2009
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9 results for Lan Wei
Impact of CNT process imperfection on circuit-level functionality and yield
- Kaship Sheikh
- Shu Jen Han
- et al.
- 2016
- ISCAS 2016
A fully anlytical model for carbon nanotube FETs including quantum capacitances and electrostatics
- Lan Wei
- David J. Frank
- et al.
- 2011
- NSTI-Nanotech 2011
An analytical model for intrinsic carbon nanotube FETs
- Lan Wei
- David J. Frank
- et al.
- 2008
- ESSDERC 2008
Extending technology roadmap by selective device footprint scaling and parasitics engineering
- Jie Deng
- Lan Wei
- et al.
- 2008
- VLSI-TSA 2008
CNFET with Process Imperfection: Impact on Circuit-Level Yield and Device Optimization
- Kaship Sheikh
- Shu Jen Han
- et al.
- 2016
- IEEE TCAS-I
Compact model for carbon nanotube field-effect transistors including nonidealities and calibrated with experimental data down to 9-nm gate length
- Jieying Luo
- Lan Wei
- et al.
- 2013
- IEEE T-ED
Noniterative compact modeling for intrinsic carbon-nanotube FETs: Quantum capacitance and ballistic transport
- Lan Wei
- David J. Frank
- et al.
- 2011
- IEEE T-ED
Selective device structure scaling and parasitics engineering: A way to extend the technology roadmap
- Lan Wei
- Jie Deng
- et al.
- 2009
- IEEE Transactions on Electron Devices