Shape slack: A design-manufacturing co-optimization methodology using tolerance information
- Shayak Banerjee
- Kanak B. Agarwal
- et al.
- 2013
- J. Micro/Nanolithogr. MEMS MOEMS
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88 results for Sani R. Nassif
Yield estimation via multi-cones
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2012
- DAC 2012
Accelerated statistical simulation via on-demand Hermite spline interpolations
- Rouwaida Kanj
- Tong Li
- et al.
- 2011
- ICCAD 2011
Electrically-driven retargeting for nanoscale layouts
- Shayak Banerjee
- Kanak B. Agarwal
- et al.
- 2011
- CICC 2011
The impact of statistical leakage models on design yield estimation
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2011
- VLSI Design
Simultaneous layout migration and decomposition for double patterning technology
- Chin-Hsiung Hsu
- Yao-Wen Chang
- et al.
- 2011
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The design and characterization of a half-volt 32 nm dual-read 6T SRAM
- Jente B. Kuang
- Jeremy D. Schaub
- et al.
- 2011
- IEEE TCAS-I
A 32nm 0.5V-supply dual-read 6T SRAM
- Jente B. Kuang
- J. Schaub
- et al.
- 2010
- CICC 2010
Statistical leakage modeling for accurate yield analysis: The CDF matching method and its alternatives
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2010
- ISLPED 2010
Tutorial proposal for ICM 2009
- Fadi Kurdahi
- Sani Nassif
- 2009
- ICM 2009