Microscopy of chemical-potential variations on an atomic scale
- C.C. Williams
- H.K. Wickramasinghe
- 1990
- Nature
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56 results for H. Kumar Wickramasinghe
Scanning probe microscopy: Current status and future trends
- H. Kumar Wickramasinghe
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Magnetic force microscopy with 25 nm resolution
- Philip C. D. Hobbs
- David W. Abraham
- et al.
- 1989
- Applied Physics Letters
Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1989
- Applied Physics Letters
Metrology with an atomic force microscope
- P.C.D. Hobbs
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
Absolute optical ranging with 200-nm resolution
- C.C. Williams
- H.K. Wickramasinghe
- 1989
- Optics Letters
Optical absorption microscopy and spectroscopy with nanometre resolution
- J.M.R. Weaver
- L.M. Walpita
- et al.
- 1989
- Nature
High-resolution capacitance measurement and potentiometry by force microscopy
- Yves Martin
- David W. Abraham
- et al.
- 1988
- Applied Physics Letters
Some history and technology of scanning microscopy
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
Thermal and photo thermal imaging on a sub 100 nanometer scale
- C.C. Williams
- H.K. Wickramasinghe
- 1988
- SPIE OE/LASE 1988