Latchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
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35 results for Robert Gauthier
Electrostatic discharge induced oxide breakdown characterization in a 0.1 μm CMOS technology
- A. Salman
- R. Gauthier
- et al.
- 2002
- IRPS 2002
Latchup in CMOS technology
- M. Hargrove
- S. Voldman
- et al.
- 1998
- IRPS 1998
Degradation of high-κ/metal gate nMOSFETs under ESD-like stress in a 32-nm technology
- Yang Yang
- Robert J. Gauthier
- et al.
- 2011
- IEEE T-DMR
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis