Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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35 results for Robert Gauthier

Latchup Analysis Using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- Microelectronics Reliability
Electrostatic discharge induced oxide breakdown characterization in a 0.1 μm CMOS technology
- - A. Salman
  - R. Gauthier
  - et al.
- 2002
- IRPS 2002
Latchup in CMOS technology
- - M. Hargrove
  - S. Voldman
  - et al.
- 1998
- IRPS 1998
Degradation of high-κ/metal gate nMOSFETs under ESD-like stress in a 32-nm technology
- - Yang Yang
  - Robert J. Gauthier
  - et al.
- 2011
- IEEE T-DMR
I/O interface latchup analysis using optical and electrical testing
- - Franco Stellari
  - Peilin Song
  - et al.
- 2004
- Electronic Device Failure Analysis