Force modulation for improved conductive-mode atomic force microscopyWabe W. KoelmansAbu Sebastianet al.2010NANO 2010
Scanning probe microscopy using higher-mode electrostatically-actuated microcantileversDeepak R. SahooVenkataraman Kartiket al.2010MECH 2010
High speed nanopositioner with magneto resistance-based position sensingVenkataraman KartikAbu Sebastianet al.2010MECH 2010
Performance evaluation of the probe storage channelThomas P. ParnellHaralampos Pozidiset al.2009GLOBECOM 2009
Novel scanning probe concepts for nanoscale electrical characterizationAbu SebastianHarish Bhaskaranet al.2009NANO 2009
Estimation of amorphous fraction in multilevel phase change memory cellsNikolaos PapandreouA. Pantaziet al.2009ESSDERC 2009
High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensorD.R. SahooW. Häberleet al.2009ACC 2009
Probabilistic data detection for probe-based storage channels in the presence of jitterHaralampos PozidisGiovanni Cherubini2009IEEE ICC 2009