A systematic study of temperature, polarity, thickness, and ramp rate dependencies of ramp-voltage stress for SiO2 and its comparison with 2D gate dielectrics
- Ernest Y Wu
- Richard G. Southwick
- et al.
- 2025
- IRPS 2025
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Systematic multiple filament statistical methodology using a successive varying-voltage technique for series resistance effect in post-breakdown (forming) characterization
- Ernest Y Wu
- Baozhen Li
- et al.
- 2022
- IEDM 2022