Variation of thin film edge magnetic properties with patterning process conditions in Ni80Fe20 stripes
- Brian B. Maranville
- Robert D. McMichael
- et al.
- 2007
- Applied Physics Letters
Publications
69 results for David Abraham
Evidence for segregation of Te in Ge2 Sb2 Te5 films: Effect on the "phase-change" stress
- L. Krusin-Elbaum
- C. Cabral
- et al.
- 2007
- Applied Physics Letters
Magnetic properties of ultra-thin NiFe films
- S. Franz
- M. Bestetti
- et al.
- 2004
- ECS Meeting 2004
Materials and devices for reduced switching field toggle magnetic random access memory
- D.C. Worledge
- P.L. Trouilloud
- et al.
- 2006
- Journal of Applied Physics
Low power scaling using parallel coupling for toggle magnetic random access memory
- 2006
- Applied Physics Letters
Rapid-turnaround characterization methods for MRAM development
- David W. Abraham
- Philip L. Trouilloud
- et al.
- 2006
- IBM J. Res. Dev
Absence of magnetism in hafnium oxide films
- 2005
- Applied Physics Letters
Recent advances in MRAM technology
- W.J. Gallagher
- D.W. Abraham
- et al.
- 2005
- VLSI Technology 2005
Observation of switching of magnetic particle arrays with weak dipole interaction field effects
- David W. Abraham
- Y. Lu
- 2005
- Journal of Applied Physics
Chemical etching of MRAM permalloy soft layers: ROLE of passive films
- E.J.M. O'Sullivan
- D.W. Abraham
- et al.
- 2003
- ECS Meeting 2003