Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)
- S.S.P. Parkin
- K.P. Roche
- et al.
- 1999
- Journal of Applied Physics
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68 results for David Abraham
Temperature and bias dependence of magnetoresistance in doped manganite thin film trilayer junctions
- J.Z. Sun
- D.W. Abraham
- et al.
- 1998
- Applied Physics Letters
Theory of magnetic force microscope images
- David W. Abraham
- F. Alan McDonald
- 1990
- Applied Physics Letters
Magnetic force microscopy with 25 nm resolution
- Philip C. D. Hobbs
- David W. Abraham
- et al.
- 1989
- Applied Physics Letters
Study of planarization of cobalt silicide lines and silicon surfaces by scanning force microscopy and scanning electron microscopy
- K.-H. Robrock
- K.N. Tu
- et al.
- 1989
- Applied Physics Letters
High-resolution capacitance measurement and potentiometry by force microscopy
- Yves Martin
- David W. Abraham
- et al.
- 1988
- Applied Physics Letters
Measurement of in-plane magnetization by force microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
Noise reduction technique for scanning tunneling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters