Publications

82 results for Marinus Hopstaken

Oxygen passivation of vacancy defects in metal-nitride gated HfO ₂/SiO₂/Si devices
- - E. Cartier
  - M. Hopstaken
  - et al.
- 2009
- Applied Physics Letters
Scaling the MOSFET gate dielectric: From high-k to higher-k? (Invited Paper)
- - Martin M. Frank
  - SangBum Kim
  - et al.
- 2009
- Microelectronic Engineering