Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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182 results for Eduard Cartier

On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices
- - J. Westlinder
  - T. Schram
  - et al.
- 2003
- IEEE Electron Device Letters
Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IEEE Electron Device Letters
Low Weibull slope of breakdown distributions in high-k layers
- - Thomas Kauerauf
  - Robin Degraeve
  - et al.
- 2002
- IEEE Electron Device Letters
Electrical characterization of Al₂O₃ n-channel MOSFETs with aluminum gates
- - L.Å. Ragnarsson
  - S. Guha
  - et al.
- 2001
- IEEE Electron Device Letters
Imaging hot-electron emission from metal-oxide-semiconductor structures
- - Marián Maňkoš
  - R.M. Tromp
  - et al.
- 1996
- Physical Review Letters
Atomic hydrogen reactions with Pb centers at the (100) Si/SiO2 interface
- - J.H. Stathis
  - E. Cartier
- 1994
- Physical Review Letters
Breakdown of the semiclassical description of hot-electron dynamics in SiO2
- - E.A. Eklund
  - F.R. McFeely
  - et al.
- 1992
- Physical Review Letters
Direct determination of impact-ionization rates near threshold in semiconductors using soft-x-ray photoemission
- - E.A. Eklund
  - P.D. Kirchner
  - et al.
- 1992
- Physical Review Letters
Soft-x-ray induced core-level photoemission as a probe of hot-electron dynamics in SiO2
- - F.R. McFeely
  - E. Cartier
  - et al.
- 1990
- Physical Review Letters
Process-Induced ReRAM Performance Improvement of Atomic Layer Deposited HfO2 for Analog In-Memory Computing Applications
- - Steven Consiglio
  - H. Higuchi
  - et al.
- 2021
- IMCS 2021