Characterization of reactively sputtered ruthenium dioxide for very large scale integrated metallization
- L. Krusin-Elbaum
- M. Wittmer
- et al.
- 1987
- Applied Physics Letters
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135 results for Lia Krusin-Elbaum
Transport in refractory metals and their interaction with SiO2: Comparison of tungsten and molybdenum
- L. Krusin-Elbaum
- M.O. Aboelfotoh
- et al.
- 1987
- Thin Solid Films
On the Resistivity of TiSi2: The Implication for Low-Temperature Applications
- Lia Krusin-Elbaum
- Jack Yuan-Chen Sun
- et al.
- 1987
- IEEE T-ED
LPCVD TUNGSTEN SILICIDE WITH TITANIUM UNDERLAYER.
- R.V. Joshi
- L. Krusin-Elbaum
- et al.
- 1985
- VLSI Technology 1985
Effects of deposition methods on the temperature-dependent resistivity of tunasten films
- L. Krusin-Elbaum
- K.Y. Ahn
- et al.
- 1986
- JVSTA
Shifts in the flatband voltage of metal-oxide-silicon structure due to iodine in SiO2
- L. Krusin-Elbaum
- G.A. Sai-Halasz
- 1986
- Applied Physics Letters
Low-field susceptibility of GdAl spin glass: Cooling-rate dependence and field dependence of peak temperature
- M. Matsui
- A.P. Malozemoff
- et al.
- 1985
- Journal of Applied Physics
TEMPERATURE DEPENDENT RESISTIVITY OF THIN FILMS OF NITRIDES OF Zr AND Hf; EFFECT ON NITROGEN CONTENT.
- L. Krusin-Elbaum
- 1983
- VLSI Science and Technology 1983
THRESHOLD CHARACTERISTICS OF MUTUALLY COUPLED SQUIDS.
- C.C. Chi
- L. Krusin-Elbaum
- et al.
- 1983
- International Conference on Low Temperature Physics (LT) 1983
TEMPERATURE DEPENDENT RESISTIVITY OF THIN FILMS OF NITRIDES OF Zr AND Hf; EFFECT OF NITROGEN CONTENT.
- L. Krusin-Elbaum
- 1983
- ECS Meeting 1983