Formation of a crystalline metal-rich suicide in thin film titanium/silicon reactions
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1996
- Thin Solid Films
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152 results for Jean L. Jordan-Sweet
Unique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin films
- J.L. Jordan-Sweet
- P.M. Mooney
- et al.
- 1996
- Journal of Applied Physics
Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
Evolution of strain relaxation in step-graded SiGe/Si structures
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters
Dislocation nucleation barrier in SiGe/Si structures graded to pure Ge
- P.M. Mooney
- F. Legoues
- et al.
- 1994
- Applied Physics Letters
Evidence for two-step disordering of the Au(110)-:1 × 2 reconstructed surface
- D.T. Keane
- P.A. Bancel
- et al.
- 1991
- Surface Science
Electronic structure of polyimide and related monomers: Theory and experiment
- Steven P. Kowalczyk
- Sven Stafström
- et al.
- 1990
- Physical Review B
Instrumentation for millisecond-resolution scattering studies (invited)
- G.B. Stephenson
- K.F. Ludwig Jr.
- et al.
- 1989
- Review of Scientific Instruments
X-ray scattering study of the deconstruction and thermal roughening of the Au(110) 1×3 reconstructed surface
- G.A. Held
- J.L. Jordan-Sweet
- et al.
- 1989
- Solid State Communications