Electrical Performance of Hybrid Bonding with Sub-Micron Cu-Cu Bonding Contacts: Effects of Scaling, Microstructure, and Surface MorphologySari Al ZereyAlina Bennettet al.2025ECTC 2025
Characterization of Interfacial Fracture Strength in Hybrid Bonded Wafers: A Novel Approach for High-Resolution Spatial ProfilingSathya RaghavanBen Yanget al.2025ECTC 2025
Next Generation Infrared (IR) Laser Debonding / Silicon Handle Technology for Precision Chiplet Technology ApplicationsQianwen ChenMichael Belyanskyet al.2023ECTC 2023