A test structure for characterizing local device mismatches
- Kanak Agarwal
- Frank Liu
- et al.
- 2006
- VLSI Circuits 2006
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7 results for Jim Plusquellic
Triangulating to a defect's physical coordinates using multiple supply pad iDDQS: Test chip results
- Jim Plusquellic
- Dhruva Acharyya
- et al.
- 2006
- ISTFA 2006
Sensitivity analysis of quiescent signal analysis for defect detection
- Dhruva Acharyya
- Abhishek Singh
- et al.
- 2006
- DBT 2006
Power supply transient signal analysis under real process and test hardware models
- A. Singh
- J. Plusquellic
- et al.
- 2002
- VTS 2002
Protection against hardware trojan attacks: Towards a comprehensive solution
- Swarup Bhunia
- Miron Abramovici
- et al.
- 2013
- IEEE Design and Test
Quiescent-signal analysis: A multiple supply pad /DDQ method
- Jim Plusquellic
- Dhruva Acharyya
- et al.
- 2006
- IEEE Design and Test of Computers
Power supply transient signal analysis for defect-oriented test
- Jim Plusquellic
- Abhishek Singh
- et al.
- 2003
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems