An integrated frequency response characterization system with a digital interface for analog testing
- Alberto Valdes-Garcia
- Faisal Abdel-Latif Hussien
- et al.
- 2006
- IEEE Journal of Solid-State Circuits
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.