Design of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
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51 results for Ching-Te Chuang
Selective device structure scaling and parasitics engineering: A way to extend the technology roadmap
- Lan Wei
- Jie Deng
- et al.
- 2009
- IEEE Transactions on Electron Devices
Stable high-density FD/SOI SRAM with selective back-gate bias using dual buried oxide
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2008
- IEEE International SOI Conference 2008
Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2008
- ICICDT 2008
Design and analysis of a self-repairing SRAM with on-chip monitor and compensation circuitry
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2008
- VTS 2008
Ultra-low leakage MTCMOS circuits with regular-Vt long channel stacked footers for deep sub-100 nm technologies
- Koushik K. Das
- Ching-Te Chuang
- 2008
- VLSI-DAT 2008
An on-chip test structure and digital measurement method for statistical characterization of local random variability in a process
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Journal of Solid-State Circuits
On-chip process variation detection and compensation using delay and slew-rate monitoring circuits
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- ISQED 2008
Variability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008