Slew-rate monitoring circuit for on-chip process variation detection
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2013
- IEEE Transactions on VLSI Systems
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51 results for Ching-Te Chuang
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
SRAM write-ability improvement with transient negative bit-line voltage
- Saibal Mukhopadhyay
- Rahul M. Rao
- et al.
- 2011
- IEEE Transactions on VLSI Systems
Self-repairing SRAM using on-chip detection and compensation
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2010
- IEEE Transactions on VLSI Systems
TCAD/physics-based analysis of high-density dual-BOX FD/SOI SRAM cell with improved stability
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2009
- IEEE Transactions on Electron Devices
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- IRPS 2009
A precise negative bias temperature instability sensor using slew-rate monitor circuitry
- Amlan Ghosh
- Richard B. Brown
- et al.
- 2009
- ISCAS 2009
Relaxing conflict between read stability and writability in 6T SRAM cell using asymmetric transistors
- Jae-Joon Kim
- Aditya Bansal
- et al.
- 2009
- IEEE Electron Device Letters
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- Microelectronics Reliability