Slew-rate monitoring circuit for on-chip process variation detection
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2013
- IEEE Transactions on VLSI Systems
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24 results for Richard B. Brown
A centralized supply voltage and local body bias-based compensation approach to mitigate within-die process variation
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2009
- ISLPED 2009
A precise negative bias temperature instability sensor using slew-rate monitor circuitry
- Amlan Ghosh
- Richard B. Brown
- et al.
- 2009
- ISCAS 2009
A fully differential potentiostat
- Steven M. Martin
- Fadi H. Gebara
- et al.
- 2009
- IEEE Sensors Journal
On-chip process variation detection and compensation using delay and slew-rate monitoring circuits
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- ISQED 2008
On-chip process variation detection using slew-rate monitoring circuit
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- VLSID 2008
Reducing parasitic BJT effects in partially depleted SOI digital logic circuits
- Koushik K. Das
- Ching-Te Chuang
- et al.
- 2008
- Microelectronics Journal
Parametric yield analysis and optimization in leakage dominated technologies
- Kanak Agarwal
- Rahul Rao
- et al.
- 2007
- IEEE Transactions on VLSI Systems
Wide limited switch dynamic logic circuit implementations
- Jayakumaran Sivagnaname
- Hung C. Ngo
- et al.
- 2006
- VLSID/Embedded 2006
Optimization objectives and models of variation for statistical gate sizing
- Matthew R. Guthaus
- Natesan Venkateswaran
- et al.
- 2005
- GLSVLSI 2005