Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond
- H. Kawasaki
- V.S. Basker
- et al.
- 2009
- IEDM 2009
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178 results for Wilfried Haensch
FinFET resistance mitigation through design and process optimization
- Cindy Wang
- Josephine Chang
- et al.
- 2009
- VLSI-TSA 2009
Reduction of random telegraph noise in high-κ / metal-gate stacks for 22 nm generation FETs
- N. Tega
- H. Miki
- et al.
- 2009
- IEDM 2009
1D Broken-gap tunnel transistor with MOSFET-like on-currents and sub-60mV/dec subthreshold swing
- Siyuranga O. Koswatta
- Steven J. Koester
- et al.
- 2009
- IEDM 2009
Reliability of a 300-mm-compatible 3DI technology based on hybrid Cu-adhesive wafer bonding
- R.R. Yu
- F. Liu
- et al.
- 2009
- VLSI Technology 2009
Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm
- N. Tega
- H. Miki
- et al.
- 2009
- VLSI Technology 2009
Contact resistivity of NiPtSi on n-doped silicon activated by laser annealing
- Francois Pagette
- Paul M. Solomon
- et al.
- 2008
- MRS Proceedings 2008
Undoped-body extremely thin SOI MOSFETs with back gates
- Amlan Majumdar
- Zhibin Ren
- et al.
- 2009
- IEEE Transactions on Electron Devices
Gate length and performance scaling of undoped-body extremely thin SOI MOSFETs
- Amlan Majumdar
- Xinlin Wang
- et al.
- 2009
- IEEE Electron Device Letters
SOI series MOSFET for embedded high voltage applications and soft-error immunity
- Jin Cai
- Tak Ning
- et al.
- 2008
- IEEE International SOI Conference 2008