Ion Microbeam Radiation System
- D. Heidel
- U. Bapst
- et al.
- 1993
- IEEE TNS
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55 results for David F. Heidel
Electron beam tester measurements of switching noise in VLSI circuits
- Keith A. Jenkins
- David F. Heidel
- 1991
- Microelectronic Engineering
Ion Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAM
- Linda M. Geppert
- David F. Heidel
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
A 12-ns Low-Temperature DRAM
- Walter H. Henkels
- Nicky C. C. Lu
- et al.
- 1989
- IEEE T-ED
Monte Carlo analysis of Josephson logic devices
- D. Heidel
- 1983
- IEEE Transactions on Magnetics