Technologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Publications
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55 results for David F. Heidel
Cellular supercomputing with system-on-a-chip
- G. Almasi
- G. Almasi
- et al.
- 2002
- ISSCC 2002
Asynchronous interlocked pipelined CMOS circuits operating at 3.3-4.5Ghz
- S.E. Schuster
- W. Reohr
- et al.
- 2000
- ISSCC 2000
Submicron CMOS Gate Electrode Discontinuity: Electrical Signature and Effect on Circuit Speed
- Keith A. Jenkins
- J.N. Burghartz
- et al.
- 1993
- IEDM 1993
A 5Gb/s 16×16 Si-bipolar crosspoint switch
- Hyun Shin
- James Warnock
- et al.
- 1992
- ISSCC 1992
Self-Biasing Josephson Logic Circuits
- T.R. Gheewala
- D. Heidel
- 1982
- IEEE Electron Device Letters
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- RADECS 2011
Recent single event effects compendium of candidate electronics for NASA space systems
- Martha V. O'Bryan
- Kenneth A. LaBel
- et al.
- 2011
- REDW/NSREC 2011
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2009
- RADECS 2009