Device scaling limits of Si MOSFETs and their application dependencies
- David J. Frank
- Robert H. Dennard
- et al.
- 2001
- Proceedings of the IEEE
Publications
109 results for David J. Frank
Analysis of the design space available for high-k gate dielectrics in nanoscale MOSFETs
- David J. Frank
- Hon-Sum P. Wong
- 2000
- Superlattices and Microstructures
Future prospects for Si CMOS technology
- D.J. Frank
- Y. Taur
- et al.
- 1999
- DRC 1999
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Circuits 1999
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Technology 1999
Nanoscale CMOS
- Hon-Sum Philip Wong
- David J. Frank
- et al.
- 1999
- Proceedings of the IEEE
25 nm CMOS design considerations
- Y. Taur
- C. Wann
- et al.
- 1998
- IEDM 1998
Generalized scale length for two-dimensional effects in MOSFET's
- David J. Frank
- Yuan Taur
- et al.
- 1998
- IEEE Electron Device Letters
RF perspective of sub-tenth-micron CMOS
- C. Wann
- L. Su
- et al.
- 1998
- ISSCC 1998
Discrete random dopant distribution effects in nanometer-scale MOSFETs
- Hon-Sum Philip Wong
- Yuan Taur
- et al.
- 1998
- Microelectronics Reliability