DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
- Amith Singhee
- Emrah Acar
- et al.
- 2012
- ISQED 2012
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17 results for Rama N. Singh
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Layout-aware through-process circuit analysis
- Rama Singh
- Matt Ziegler
- et al.
- 2007
- DTIS 2007
Topics in polarization ray tracing for image projectors
- Alan E. Rosenbluth
- Gregg Gallatin
- et al.
- 2005
- SPIE Optics + Photonics 2005
Image fidelity verification - ContourIFV
- Ioana Graur
- Rama N. Singh
- et al.
- 2004
- AMM 2004
Failure prediction across process window for robust OPC
- Shumay D. Shang
- Yuri Granik
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Failure prediction across process window for robust OPC
- Shumay D. Shang
- Yuri Granik
- et al.
- 2003
- SPIE Advanced Lithography 2003
Optimum mask and source patterns to print a given shape
- Alan E. Rosenbluth
- Rama N. Singh
- et al.
- 2002
- Journal of Microlithography, Microfabrication and Microsystems
Illumination system for color filterless liquid crystal display
- Yoichi Taira
- Daiju Nakano
- et al.
- 2002
- EURODISPLAY 2002