Hot carrier electroluminescence from a single carbon nanotube
- Marcus Freitag
- Vasili Perebeinos
- et al.
- 2004
- Nano Letters
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135 results for James C. Tsang
Watching chips work: Optical imaging of hot carriers in ICs
- J.C. Tsang
- 2002
- ECS Meeting 2002
Electrically induced optical emission from a carbon nanotube FET
- J. Misewich
- R. Martel
- et al.
- 2003
- Science
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2002
- ISTFA 2002
Intercalation compounds of metal hydroxides with group V layered dichalcogenides
- G. V. Subba Rao
- M.W. Shafer
- et al.
- 2002
- Journal of Physical Chemistry
How industry matters in balancing the federal research portfolio
- J.C. Tsang
- 2002
- Technology in Society
Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- Franco Stellari
- Franco Zappa
- et al.
- 2001
- IEEE Transactions on Electron Devices
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
- J.C. Tsang
- M.V. Fischetti
- 2001
- Microelectronics Reliability
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- S. Cova
- C. Porta
- et al.
- 2000
- ESSDERC 2000