Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
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135 results for James C. Tsang
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- S. Cova
- C. Porta
- et al.
- 2000
- ESSDERC 2000
Chips at Work: Picosecond Imaging Circuit Analysis
- J.A. Kash
- J.C. Tsang
- 1999
- UEO 1999
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
Temporal characterization of CMOS circuits by time resolved emission microscopy
- J.C. Tsang
- J.A. Kash
- 1997
- DRC 1997
Optical imaging of picosecond switching in CMOS circuits
- J.A. Kash
- J.C. Tsang
- 1997
- CLEO 1997
Backside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1997
- CICC 1997
Microstructural evolution and substrate selectivity in PECVD μc-Si
- G.N. Parsons
- J.J. Boland
- et al.
- 1992
- Symposium on Dynamics in Small Confining Systems 1992
Finite layer thickness and disorder effects in Raman scattering from ultrathin Ge films
- James C. Tsang
- 1992
- QELS 1992
Intervalley and electron-electron scattering rates measured in p-GaAs with hot electron luminescence
- J.A. Kash
- R. Ulbrich
- et al.
- 1989
- QELS 1989