Conference paper
Optical diagnostics for IBM POWER6 TM Microprocessor
Peilin Song, Stephen Ippolito, et al.
IEEE ITC 2008
Noninvasive characterization of CMOS ring oscillator with 50 ps resolution is obtained by exploiting the broad-band infrared emission from switching transistors. A fast silicon single-photon avalanche-diode (SPAD) is used to attain high sensitivity and time resolution. Switching transitions of both n- and p-channel MOSFETs are measured and the main features in the circuit operation are characterized. Systematic variations and increased jitter of switching transitions due to phase noise are accurately measured.
Peilin Song, Stephen Ippolito, et al.
IEEE ITC 2008
Franco Stellari, Chung Ching Lin, et al.
ISTFA 2015
Alan J. Weger, Franco Stellari, et al.
ISTFA 2013
Franco Stellari, Steven E. Steen, et al.
IRPS 2010