Using well/substrate bias manipulation to enhance voltage-test-based defect detection
- Anne Gattiker
- Phil Nigh
- 2011
- IEEE ITC 2011
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Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- Phil Nigh
- Anne Gattiker
- 2004
- IEEE ITC 2004
Current-Signature-Based Analysis of Complex Test Fails
- Anne Gattiker
- Phil Nigh
- et al.
- 1999
- ISTFA 1999
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998