Pattern transfer of directed self-assembly patterns for CMOS device applications
- Hsin-Yu Tsai
- Hiroyuki Miyazoe
- et al.
- 2013
- J. Micro/Nanolithogr. MEMS MOEMS
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29 results for Christopher M. Breslin
A novel integrated reliability test system for BEOL TDDB study
- Jifeng Chen
- Peilin Song
- et al.
- 2012
- ISTFA 2012
Microstructure, impurity and metal cap effects on Cu electromigration
- C. K. Hu
- Lynne Gignac
- et al.
- 2012
- AIP-CP 2012
Electromigration in Cu(Al) and Cu(Mn) damascene lines
- C.-K. Hu
- J. Ohm
- et al.
- 2012
- Journal of Applied Physics
InAs nanowire growth on oxide-masked 〈111〉 silicon
- Mikael T. Björk
- Heinz Schmid
- et al.
- 2012
- Journal of Crystal Growth
Sub-10 nm carbon nanotube transistor
- Aaron D. Franklin
- Mathieu Luisier
- et al.
- 2012
- Nano Letters
Sub-10 nm carbon nanotube transistor
- Aaron D. Franklin
- Shu-Jen Han
- et al.
- 2011
- IEDM 2011
Effects of Al and Mn impurities on Cu electromigration
- C.-K. Hu
- J. Ohm
- et al.
- 2011
- ADMETA 2011
Multilayer epitaxial graphene formed by pyrolysis of polycrystalline silicon-carbide grown on c-plane sapphire substrates
- Timothy J. Mcardle
- Jack O. Chu
- et al.
- 2011
- Applied Physics Letters