Novel enhanced stressor with graded embedded SiGe source/drain for high performance CMOS devices
- J.-P. Han
- H. Utomo
- et al.
- 2006
- IEDM 2006
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4 results for Lindsay E. Burns
An overview of 300mm SOI starting wafer quality and its yield detractors
- Pei Y. Tsai
- Marlene Almonte
- et al.
- 2005
- ISTFA 2005
Experiences in implementing simulation-based support for operational decision making in semiconductor manufacturing
- Ching-Hua Chen-Ritzo
- Sugato Bagchi
- et al.
- 2011
- European Journal of Industrial Engineering
Hybrid-orientation technology (HOT): Opportunities and challenges
- Min Yang
- Victor W.C. Chan
- et al.
- 2006
- IEEE Transactions on Electron Devices