Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices towards Scalable Analog Compute Technology for Deep Learning
- Ruturaj Pujari
- Arthur Gasasira
- et al.
- 2021
- ASMC 2021
Publications
93 results for Takashi Ando
Resistive Memory Process Optimization for High Resistance Switching Toward Scalable Analog Compute Technology for Deep Learning
- Youngseok Kim
- Soon-Cheon Seo
- et al.
- 2021
- IEEE Electron Device Letters
Junction Design and Complementary Capacitance Matching for NCFET CMOS Logic
- Reinaldo A. Vega
- Takashi Ando
- et al.
- 2021
- IEEE J-EDS
Bottom electrode properties and electrical field cycling effects on hfox based resistive switching memory device
- J. Li
- Youngseok Kim
- et al.
- 2020
- ISTFA 2020
A Simulation Study on Minimizing Threshold Voltage Variability by Optimizing Oxygen Vacancy Concentration under Metal Gate Granularity
- Madhu Padmanabha Sumangala
- Ahish Shylendra
- et al.
- 2020
- IEEE Electron Device Letters
Fundamental roles of extreme-value distributions in dielectric breakdown and memory applications (minimum-value versus maximum-value statistics)
- Ernest Wu
- Takashi Ando
- et al.
- 2020
- Japanese Journal of Applied Physics
BEOL compatible high-capacitance MIMCAP structure using a novel high k material
- P. Jamison
- John Massey
- et al.
- 2020
- IMCS 2020
A maximum extreme-value distribution model for switching conductance of oxide-RRAM in memory applications
- Ernest Wu
- Takashi Ando
- et al.
- 2020
- Applied Physics Letters
Filamentary Statistical Evolution from Nano-Conducting Path to Switching-Filament for Oxide-RRAM in Memory Applications
- Ernest Wu
- Takashi Ando
- et al.
- 2019
- IEDM 2019
Ultra-scaled Conformal Scavenging Electrode with Superior Tunability for Short-channel RMG FinFET Workfunction and all-ALD 3D-compatible ReRAM
- John Rozen
- K. Suu
- et al.
- 2019
- IEDM 2019