General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition
- Ernest Wu
- Takashi Ando
- et al.
- 2024
- IRPS 2024
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88 results for Takashi Ando
Analog Resistive Switching Devices for Training Deep Neural Networks with the Novel Tiki-Taka Algorithm
- Tommaso Stecconi
- Valeria Bragaglia
- et al.
- 2024
- Nano Letters
ReSta: Recovery of Accuracy During Training of Deep Learning Models in a 14-nm Technology-Based ReRAM Array
- Fabia Farlin Athena
- Nanbo Gong
- et al.
- 2023
- IEEE T-ED
Material to system-level benchmarking of CMOS-integrated RRAM with ultra-fast switching for low power on-chip learning
- Minhaz Abedin
- Nanbo Gong
- et al.
- 2023
- Scientific Reports
Reversing A Decades-Long Scaling Law of Dielectric Breakdown using Hydrogen-Plasma-Treated HfO2 ReRAM Devices
- Ernest Y. Wu
- Takashi Ando
- et al.
- 2023
- Advanced Electronic Materials
Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
Deep learning acceleration in 14nm CMOS compatible ReRAM array: device, material and algorithm co-optimization
- N. Gong
- Malte J. Rasch
- et al.
- 2022
- IEDM 2022
Neural network learning using non-ideal resistive memory devices
- Youngseok Kim
- Tayfun Gokmen
- et al.
- 2022
- Frontiers in Nanotechnology
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2022
- ESSDERC 2022
Photon Emission Microscopy of Amorphous HfO2 ReRAM Cells
- Franco Stellari
- Leonidas E. Ocola
- et al.
- 2022
- IPFA 2022