Publications

88 results for Takashi Ando

General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition
- - Ernest Wu
  - Takashi Ando
  - et al.
- 2024
- IRPS 2024
Analog Resistive Switching Devices for Training Deep Neural Networks with the Novel Tiki-Taka Algorithm
- - Tommaso Stecconi
  - Valeria Bragaglia
  - et al.
- 2024
- Nano Letters
ReSta: Recovery of Accuracy During Training of Deep Learning Models in a 14-nm Technology-Based ReRAM Array
- - Fabia Farlin Athena
  - Nanbo Gong
  - et al.
- 2023
- IEEE T-ED
Material to system-level benchmarking of CMOS-integrated RRAM with ultra-fast switching for low power on-chip learning
- - Minhaz Abedin
  - Nanbo Gong
  - et al.
- 2023
- Scientific Reports
Reversing A Decades-Long Scaling Law of Dielectric Breakdown using Hydrogen-Plasma-Treated HfO₂ ReRAM Devices
- - Ernest Y. Wu
  - Takashi Ando
  - et al.
- 2023
- Advanced Electronic Materials
Mapping and statistical analysis of filaments locations in amorphous HfO₂ ReRAM cells
- - Franco Stellari
  - Ernest Y. Wu
  - et al.
- 2023
- Microelectronics Reliability
Deep learning acceleration in 14nm CMOS compatible ReRAM array: device, material and algorithm co-optimization
- - N. Gong
  - Malte J. Rasch
  - et al.
- 2022
- IEDM 2022
Neural network learning using non-ideal resistive memory devices
- - Youngseok Kim
  - Tayfun Gokmen
  - et al.
- 2022
- Frontiers in Nanotechnology
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation
- - Franco Stellari
  - Ernest Y. Wu
  - et al.
- 2022
- ESSDERC 2022
Photon Emission Microscopy of Amorphous HfO2 ReRAM Cells
- - Franco Stellari
  - Leonidas E. Ocola
  - et al.
- 2022
- IPFA 2022