Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
- J. Jobst
- A. J.H. van der Torren
- et al.
- 2016
- Nature Communications
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13 results for J. Jobst
Nanoscale measurements of unoccupied band dispersion in few-layer graphene
- J. Jobst
- Jaap Kautz
- et al.
- 2015
- Nature Communications
Low-energy electron potentiometry: Contactless imaging of charge transport on the nanoscale
- Jaap Kautz
- J. Jobst
- et al.
- 2015
- Scientific Reports
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
Low energy electron microscopy at cryogenic temperatures
- Arash Tebyani
- Sebastian Schramm
- et al.
- 2023
- Ultramicroscopy
Stacking domain morphology in epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Luuk Visser
- et al.
- 2023
- Physical Review Materials
Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Xingchen Chen
- et al.
- 2023
- Physical Review B
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy