The dawn of predictive chip yield design: Along and beyond the memory lane
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2010
- IEEE Design and Test of Computers
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Evaluation and alleviation of SOI impacts on SRAM functionality and yield
- Antonio R. Pelella
- Rajiv Joshi
- et al.
- 2008
- IEEE International SOI Conference 2008